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DS21372
3.3V、位误码率测试器(BERT)


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数据资料
完整的数据资料 (PDF, 184kB)
英文 Download this datasheet in PDF format下载

概述
The DS21372 Bit Error Rate Tester (BERT) is a software-programmable test pattern generator, receiver, and analyzer capable of meeting the most stringent error performance requirements of digital transmission facilities. Two categories of test pattern generation (pseudorandom and repetitive) conform to CCITT/ITU O.151, O.152, O.153, and O.161 standards. The DS21372 operates at clock rates ranging from DC to 20MHz. This wide range of operating frequency allows the DS21372 to be used in existing and future test equipment, transmission facilities, switching equipment, multiplexers, DACs, routers, bridges, CSUs, DSUs, and CPE equipment.

The DS21372 user-programmable pattern registers provide the unique ability to generate loopback patterns required for T1, Fractional-T1, Smart Jack, and other test procedures. Hence the DS21372 can initiate the loopback, run the test, check for errors, and, finally, deactivate the loopback.

The DS21372 consists of four functional blocks: the pattern generator, pattern detector, error counter, and control interface. The DS21372 can be programmed to generate any pseudorandom pattern with length up to 232-1 bits (see table 5, note 9 in data sheet) or any user-programmable bit pattern from 1 to 32 bits in length. Logic inputs can be used to configure the DS21372 for applications requiring gap clocking such as Fractional-T1, Switched-56, DDS, normal framing requirements, and per-channel test procedures. In addition, the DS21372 can insert single or 10-1 to 10-7 bit errors to verify equipment operation and connectivity.

关键特性
  • Generates/detects digital bit patterns for analyzing, evaluating, and troubleshooting digital communications systems
  • Operates at speeds from DC to 20MHz
  • Programmable polynomial length and feedback taps for generation of any other pseudorandom pattern up to 32 bits in length including: 26-1, 29-1, 211-1, 215-1, 220-1, 223-1, and 232-1
  • Programmable user-defined pattern and length for generation of any repetitive pattern up to 32 bits in length
  • Large 32-bit error count and bit count registers
  • Software-programmable bit-error insertion
  • Fully independent transmit and receive sections
  • 8-bit parallel control port
  • Detects test patterns with bit error rates up to 10-2

Key Specifications:   T/E Carrier & Packetized Products
Part Number Functions Number of Channels Supply Voltage (V) RoHS Available Package Smallest Available Package (max w/pins) (mm2) Price**
DS21372 
Bit Error-Rate Tester
1 3.3 Yes TQFP/32 85 $6.78 @ 1k
See All T/E Carrier & Packetized Products (96)
Notes:
**This pricing is BUDGETARY, for comparing similar parts. Prices are in U.S. dollars and subject to change. Quantity pricing may vary substantially and international prices may differ due to local duties, taxes, fees, and exchange rates. For volume-specific prices and delivery, please see the price and availability page or contact an authorized distributor.

应用笔记
  • App Note 334: DS2172 BERT Interface to all Dallas Framers and Transceivers - DS21372 (English only)

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    设计指南
  • 通信 (PDF)

    可靠性报告
  • 可靠性报告: DS21372.pdf (English only)

    软件/模型

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    1. 购买产品,请访问:http://www.maxim-ic.com.cn/sales
    2. 没有找到您所需要的器件?请咨询我们的应用工程师。我们的专家会帮助您找到合适的器件,通常在一个工作日内回复。
    3. 型号尾缀:T或T&R = 卷带; + = RoHS/无铅; # = RoHS/无铅豁免权。详细信息请参考:完整的数据资料型号命名规则
    4. * “封装代码/变更”提供产品使用的变更信息。注意:型号尾缀中的“+”、“#”和“-”表示器件的RoHS状况,封装图上可能显示不同的尾缀字符。


    器件: 1-4 of 4

    DS21372 免费样品 采购
    封装: 类型 引脚 占位面积
      封装图编码/变更 *
    温度 RoHS/无铅?
    材料分析
    DS21372T  
    TQFP;32引脚;85mm²
    封装图: 56-G4004-001A (PDF)
    使用封装码/变更:C32-3*
    0°C至+70°C RoHS/无铅:
    材料分析
    DS21372T+  
    TQFP;32引脚;85mm²
    封装图: 56-G4004-001A (PDF)
    使用封装码/变更:C32+3*
    0°C至+70°C RoHS/无铅:无铅
    材料分析
    DS21372TN+  
    TQFP;32引脚;85mm²
    封装图: 56-G4004-001A (PDF)
    使用封装码/变更:C32+3*
    -40°C至+85°C RoHS/无铅:无铅
    材料分析
    DS21372TN  
    TQFP;32引脚;85mm²
    封装图: 56-G4004-001A (PDF)
    使用封装码/变更:C32-3*
    -40°C至+85°C RoHS/无铅:
    材料分析

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    2000-10-10
    本页最后一次更新: 2007-06-21



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