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Maxim >
质量担保与可靠性 >
可靠性报告
> 监督报告 |
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可靠性监控流程(Q3 2000) |
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- Reliability Monitor Program (RMP) Description (PDF)
An overview of the RMP and a detailed description of the data summaries and stress tests used in the RMP.
- RMP Device Sampling Plan (PDF)
A table of products, packages, and assembly sites included in the Monitors. Frequency and sample sizes are also included.
- RMP Process Sampling Plan (PDF)
A table of vehicles used to monitor Dallas Semiconductor Technologies.
- RMP Stress Tests (PDF)
Test Plan for Modules, IC's, SipStik's, and Touch Memory.
- IC Reliability Data (PDF)
Single lot snapshots of integrated circuit device types from the Sampling Plan. Data includes details for read points, sample sizes, and failures, as well as, a calculated failure rate for Operating Life. Failure Analysis and Corrective Actions are included where appropriate.
- Module Reliability Data (PDF)
Single lot snapshots of Module, Touch Memory, and SipStik devices from the Sampling Plan. Data includes details for read points, sample sizes, and failures. Failure Analysis and Corrective Actions are included where appropriate.
- Process Reliability Summary (PDF)
A summary listing of IC Process Reliability data generated by the RMP for the past quarter and organized by technology. Failure rates are calculated for the entire technology family.
- Assembly Package Reliability Summary (PDF)
A summary listing of Assembly/Package Process Reliability data generated by the RMP for the past quarter and organized by Assembly Site/Package type.
- Outgoing Quailty Summary (PDF)
Quality Data for the last eight quarters.
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